TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_40_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-004-022-05 | FUSED_ID : 6359364768398066021
  IC_TEMP :  -50.15 | VDDM : 1126.20 | AUX_INT :  -17.71 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56465e-03 / 2
  ADC_P0  : -1.77054e-02 ± 2.73123e-02
  ADC_P1  : 8.49381e-03 ± 6.68305e-04
  ADC_P2  : -6.08149e-06 ± 3.24358e-06
  CSA_Chi2/NDF : 8.60427e-05 / 2
  CSA_P0  : 5.83060e-02 ± 6.18699e-03
  CSA_P1  : 9.20528e-03 ± 4.66145e-04
  CSA_P2  : -3.53727e-05 ± 7.09884e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [64, 66, 69, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [38, 39, 40, 47, 69, 91, 94, 98, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1158', '1.800', '0.1144', '1.800', '0.0814', '7.000', '0.7080', 1, 1, 1, 1, 1726065654.3237264]
VI_after__Init : ['1.202', '0.1157', '1.800', '0.1144', '1.800', '0.0758', '7.000', '0.7080', 1, 1, 1, 1, 1726065662.4889846]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1352', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1726065729.0398405]