TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_18_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-004-15 | FUSED_ID : 6359364768398069839
  IC_TEMP :  -58.96 | VDDM : 1127.62 | AUX_INT :   -7.92 | CsaBias :   68.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13768e-03 / 2
  ADC_P0  : -7.92215e-03 ± 2.28203e-02
  ADC_P1  : 8.54282e-03 ± 5.66183e-04
  ADC_P2  : -6.48382e-06 ± 2.77571e-06
  CSA_Chi2/NDF : 1.03890e-04 / 2
  CSA_P0  : 5.69202e-02 ± 6.79845e-03
  CSA_P1  : 9.55739e-03 ± 5.12214e-04
  CSA_P2  : -4.12321e-05 ± 7.80041e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [8, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 11, 20, 30, 31, 34, 39, 69, 81, 91, 105, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3019', '1.800', '0.1557', '1.799', '0.0902', '7.000', '0.7076', 1, 1, 1, 1, 1726067885.5046058]
VI_after__Init : ['1.202', '0.3021', '1.800', '0.1558', '1.800', '0.0842', '7.000', '0.7076', 1, 1, 1, 1, 1726067893.7240093]
VI_at__the_End : ['1.201', '0.4918', '1.800', '0.1401', '1.806', '0.1130', '7.000', '0.7081', 1, 1, 1, 1, 1726067960.9807591]