TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_11_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-008-15 | FUSED_ID : 6359364768398069903
  IC_TEMP :  -57.28 | VDDM : 1128.09 | AUX_INT :   -8.75 | CsaBias :   83.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50734e-03 / 2
  ADC_P0  : -8.75091e-03 ± 2.63466e-02
  ADC_P1  : 8.43860e-03 ± 6.53829e-04
  ADC_P2  : -5.73106e-06 ± 3.21835e-06
  CSA_Chi2/NDF : 1.71590e-04 / 2
  CSA_P0  : 5.98857e-02 ± 8.73711e-03
  CSA_P1  : 9.95305e-03 ± 6.58278e-04
  CSA_P2  : -4.83071e-05 ± 1.00248e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [34, 52, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 14, 26, 62, 112, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1802', '1.800', '0.1557', '1.800', '0.0831', '7.000', '0.7074', 1, 1, 1, 1, 1726067498.1131341]
VI_after__Init : ['1.202', '0.1803', '1.800', '0.1558', '1.801', '0.0772', '7.000', '0.7070', 1, 1, 1, 1, 1726067506.213592]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1415', '1.801', '0.1149', '7.000', '0.7080', 1, 1, 1, 1, 1726067572.371523]