TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_05_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-012-15 | FUSED_ID : 6359364768398069967
  IC_TEMP :  -55.45 | VDDM : 1116.99 | AUX_INT :   -8.52 | CsaBias :   83.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25737e-03 / 2
  ADC_P0  : -8.52239e-03 ± 2.40341e-02
  ADC_P1  : 8.38787e-03 ± 5.93101e-04
  ADC_P2  : -5.59777e-06 ± 2.90857e-06
  CSA_Chi2/NDF : 1.40222e-04 / 2
  CSA_P0  : 5.83146e-02 ± 7.89823e-03
  CSA_P1  : 9.79155e-03 ± 5.95075e-04
  CSA_P2  : -4.52839e-05 ± 9.06228e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [7, 52, 92, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [40, 59, 62, 103, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1743', '1.800', '0.1542', '1.800', '0.0852', '7.000', '0.7072', 1, 1, 1, 1, 1726067110.0337799]
VI_after__Init : ['1.202', '0.1743', '1.800', '0.1542', '1.800', '0.0795', '7.000', '0.7071', 1, 1, 1, 1, 1726067118.2221391]
VI_at__the_End : ['1.201', '0.4905', '1.800', '0.1370', '1.800', '0.1140', '7.000', '0.7078', 1, 1, 1, 1, 1726067186.8289745]