TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_50_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-021-08 | FUSED_ID : 6359364768398070104
  IC_TEMP :  -57.20 | VDDM : 1126.64 | AUX_INT :   -9.34 | CsaBias :   73.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54387e-03 / 2
  ADC_P0  : -9.33600e-03 ± 2.66342e-02
  ADC_P1  : 8.33228e-03 ± 6.44061e-04
  ADC_P2  : -5.93212e-06 ± 3.09261e-06
  CSA_Chi2/NDF : 1.49897e-04 / 2
  CSA_P0  : 5.89132e-02 ± 8.16618e-03
  CSA_P1  : 1.03431e-02 ± 6.15263e-04
  CSA_P2  : -5.22075e-05 ± 9.36973e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 9, 31, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [24, 84, 89, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2085', '1.800', '0.1633', '1.800', '0.0846', '7.000', '0.7079', 1, 1, 1, 1, 1726066236.9129171]
VI_after__Init : ['1.201', '0.2084', '1.800', '0.1631', '1.801', '0.0790', '7.000', '0.7080', 1, 1, 1, 1, 1726066245.04532]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1405', '1.800', '0.1144', '7.000', '0.7083', 1, 1, 1, 1, 1726066311.9974182]