TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_47_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-023-08 | FUSED_ID : 6359364768398070136
  IC_TEMP :  -51.04 | VDDM : 1133.20 | AUX_INT :   -6.47 | CsaBias :   90.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.86987e-04 / 2
  ADC_P0  : -6.46658e-03 ± 2.12892e-02
  ADC_P1  : 8.10483e-03 ± 5.15121e-04
  ADC_P2  : -5.12351e-06 ± 2.45984e-06
  CSA_Chi2/NDF : 9.14091e-05 / 2
  CSA_P0  : 5.78599e-02 ± 6.37701e-03
  CSA_P1  : 9.17801e-03 ± 4.80462e-04
  CSA_P2  : -3.49004e-05 ± 7.31686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 109, 112, 116, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 22, 25, 102, 113, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1985', '1.800', '0.1410', '1.800', '0.0833', '7.000', '0.7079', 1, 1, 1, 1, 1726066043.0517626]
VI_after__Init : ['1.201', '0.1986', '1.800', '0.1409', '1.800', '0.0780', '7.000', '0.7082', 1, 1, 1, 1, 1726066051.2062361]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1363', '1.806', '0.1118', '7.000', '0.7089', 1, 1, 1, 1, 1726066116.675516]