TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_44_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-025-08 | FUSED_ID : 6359364768398070168
  IC_TEMP :  -57.70 | VDDM : 1115.22 | AUX_INT :   -7.23 | CsaBias :   72.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.38011e-04 / 2
  ADC_P0  : -7.23195e-03 ± 2.07160e-02
  ADC_P1  : 8.97191e-03 ± 5.44933e-04
  ADC_P2  : -6.81696e-06 ± 2.83368e-06
  CSA_Chi2/NDF : 1.67040e-04 / 2
  CSA_P0  : 5.69500e-02 ± 8.62051e-03
  CSA_P1  : 1.01313e-02 ± 6.49493e-04
  CSA_P2  : -4.81442e-05 ± 9.89101e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 3, 10, 37, 52, 70, 71, 81, 93, 104, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [29, 57, 92, 100, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4460', '1.800', '0.1439', '1.800', '0.1004', '7.000', '0.7083', 1, 1, 1, 1, 1726065849.109449]
VI_after__Init : ['1.201', '0.4460', '1.800', '0.1441', '1.800', '0.0947', '7.000', '0.7078', 1, 1, 1, 1, 1726065857.2409244]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1405', '1.799', '0.1136', '7.000', '0.7088', 1, 1, 1, 1, 1726065924.386658]