TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_26_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-007-01 | FUSED_ID : 6359364768398073969
  IC_TEMP :  -52.39 | VDDM : 1124.15 | AUX_INT :   -5.69 | CsaBias :   87.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.60608e-04 / 2
  ADC_P0  : -5.68785e-03 ± 1.98702e-02
  ADC_P1  : 8.51188e-03 ± 5.07277e-04
  ADC_P2  : -5.61834e-06 ± 2.55046e-06
  CSA_Chi2/NDF : 1.16540e-04 / 2
  CSA_P0  : 5.89201e-02 ± 7.20044e-03
  CSA_P1  : 9.83575e-03 ± 5.42501e-04
  CSA_P2  : -4.41130e-05 ± 8.26166e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 53, 58, 59, 80, 99, 102, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 21, 43, 50, 91, 98, 104, 115, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2697', '1.800', '0.1376', '1.800', '0.0880', '7.000', '0.7077', 1, 1, 1, 1, 1726068369.3016825]
VI_after__Init : ['1.202', '0.2699', '1.800', '0.1377', '1.800', '0.0824', '7.000', '0.7076', 1, 1, 1, 1, 1726068377.4780507]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1405', '1.804', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1726068445.2320633]