TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_32_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-011-01 | FUSED_ID : 6359364768398074033
  IC_TEMP :  -56.18 | VDDM : 1130.30 | AUX_INT :   -6.35 | CsaBias :   83.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.01259e-04 / 2
  ADC_P0  : -6.35090e-03 ± 1.91450e-02
  ADC_P1  : 8.26625e-03 ± 4.66214e-04
  ADC_P2  : -5.74947e-06 ± 2.24014e-06
  CSA_Chi2/NDF : 1.01994e-04 / 2
  CSA_P0  : 5.89648e-02 ± 6.73610e-03
  CSA_P1  : 9.73795e-03 ± 5.07517e-04
  CSA_P2  : -4.29576e-05 ± 7.72888e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [3, 8, 18, 40, 55, 59, 73, 89, 103, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [11, 74, 92, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3162', '1.800', '0.1651', '1.800', '0.0922', '7.000', '0.7076', 1, 1, 1, 1, 1726068757.8505974]
VI_after__Init : ['1.201', '0.3162', '1.800', '0.1651', '1.800', '0.0865', '7.000', '0.7076', 1, 1, 1, 1, 1726068765.9679534]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1390', '1.800', '0.1123', '7.000', '0.7083', 1, 1, 1, 1, 1726068831.4631376]