TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_39_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-015-01 | FUSED_ID : 6359364768398074097
  IC_TEMP :  -53.33 | VDDM : 1132.21 | AUX_INT :   -6.01 | CsaBias :   67.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.75915e-04 / 2
  ADC_P0  : -6.01336e-03 ± 1.75516e-02
  ADC_P1  : 8.25168e-03 ± 4.22377e-04
  ADC_P2  : -6.12417e-06 ± 2.00021e-06
  CSA_Chi2/NDF : 7.50717e-05 / 2
  CSA_P0  : 5.83074e-02 ± 5.77910e-03
  CSA_P1  : 9.41092e-03 ± 4.35414e-04
  CSA_P2  : -3.85375e-05 ± 6.63084e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [55, 58, 91, 94, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 20, 36, 38, 75, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3438', '1.800', '0.1749', '1.800', '0.0940', '7.000', '0.7078', 1, 1, 1, 1, 1726069139.7128458]
VI_after__Init : ['1.202', '0.3439', '1.800', '0.1749', '1.800', '0.0887', '7.000', '0.7076', 1, 1, 1, 1, 1726069147.9671664]
VI_at__the_End : ['1.202', '0.4930', '1.800', '0.1402', '1.801', '0.1111', '7.000', '0.7084', 1, 1, 1, 1, 1726069208.2726057]