TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_42_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-017-06 | FUSED_ID : 6359364768398074134
  IC_TEMP :  -54.17 | VDDM : 1133.62 | AUX_INT :   -6.61 | CsaBias :   78.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.42235e-04 / 2
  ADC_P0  : -6.60857e-03 ± 1.83949e-02
  ADC_P1  : 8.57903e-03 ± 4.60279e-04
  ADC_P2  : -6.51682e-06 ± 2.27085e-06
  CSA_Chi2/NDF : 1.25342e-04 / 2
  CSA_P0  : 5.83834e-02 ± 7.46742e-03
  CSA_P1  : 9.92055e-03 ± 5.62616e-04
  CSA_P2  : -4.50132e-05 ± 8.56798e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 14, 34, 73, 86, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 22, 56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3293', '1.800', '0.1590', '1.800', '0.0910', '7.000', '0.7086', 1, 1, 1, 1, 1726069334.055014]
VI_after__Init : ['1.202', '0.3292', '1.800', '0.1589', '1.800', '0.0839', '7.000', '0.7076', 1, 1, 1, 1, 1726069342.2123795]
VI_at__the_End : ['1.202', '0.5009', '1.800', '0.1432', '1.800', '0.1129', '7.000', '0.7086', 1, 1, 1, 1, 1726069407.2254477]