TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_43_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-018-06 | FUSED_ID : 6359364768398074150
  IC_TEMP :  -51.83 | VDDM : 1130.30 | AUX_INT :   -7.31 | CsaBias :   83.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02003e-03 / 2
  ADC_P0  : -7.30812e-03 ± 2.16175e-02
  ADC_P1  : 8.34884e-03 ± 5.28211e-04
  ADC_P2  : -5.97037e-06 ± 2.54969e-06
  CSA_Chi2/NDF : 9.39131e-05 / 2
  CSA_P0  : 5.79701e-02 ± 6.46376e-03
  CSA_P1  : 9.74829e-03 ± 4.86998e-04
  CSA_P2  : -4.35627e-05 ± 7.41640e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [66, 71, 103, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [23, 35, 69, 77, 97, 103, 105, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3997', '1.800', '0.1486', '1.800', '0.0931', '7.000', '0.7077', 1, 1, 1, 1, 1726069430.4137094]
VI_after__Init : ['1.202', '0.3999', '1.800', '0.1487', '1.800', '0.0875', '7.000', '0.7076', 1, 1, 1, 1, 1726069439.2489092]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1370', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1726069507.3247962]