TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_48_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-021-06 | FUSED_ID : 6359364768398074198
  IC_TEMP :  -64.04 | VDDM : 1113.29 | AUX_INT :   -7.50 | CsaBias :   61.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.56781e-04 / 2
  ADC_P0  : -7.50002e-03 ± 2.09015e-02
  ADC_P1  : 8.66247e-03 ± 5.24826e-04
  ADC_P2  : -6.75230e-06 ± 2.60148e-06
  CSA_Chi2/NDF : 1.79337e-04 / 2
  CSA_P0  : 5.87840e-02 ± 8.93219e-03
  CSA_P1  : 1.00879e-02 ± 6.72976e-04
  CSA_P2  : -5.39247e-05 ± 1.02486e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 12, 20, 32, 75, 107, 109, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [21, 32, 42, 52, 68, 70, 87, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4318', '1.800', '0.1316', '1.800', '0.0954', '7.000', '0.7080', 1, 1, 1, 1, 1726069722.1785128]
VI_after__Init : ['1.202', '0.4318', '1.800', '0.1310', '1.800', '0.0896', '7.000', '0.7080', 1, 1, 1, 1, 1726069730.2148874]
VI_at__the_End : ['1.202', '0.4739', '1.800', '0.1380', '1.800', '0.1177', '7.000', '0.7086', 1, 1, 1, 1, 1726069798.2386355]