TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_51_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-023-06 | FUSED_ID : 6359364768398074230
  IC_TEMP :  -52.51 | VDDM : 1127.25 | AUX_INT :   -9.70 | CsaBias :   84.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 1.16824e-04 / 2
  CSA_P0  : 5.81085e-02 ± 7.20921e-03
  CSA_P1  : 9.71994e-03 ± 5.43162e-04
  CSA_P2  : -4.21704e-05 ± 8.27171e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [13, 22, 44, 46, 65, 84, 87, 95, 101, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 21, 31, 53, 78, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1514', '1.800', '0.1297', '1.800', '0.0878', '7.000', '0.7080', 1, 1, 1, 1, 1726069915.524809]
VI_after__Init : ['1.202', '0.1513', '1.800', '0.1297', '1.800', '0.0826', '7.000', '0.7078', 1, 1, 1, 1, 1726069924.3430579]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1380', '1.800', '0.1113', '7.000', '0.7088', 1, 1, 1, 1, 1726069985.9503224]