TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_55_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-006-025-06 | FUSED_ID : 6359364768398074262
  IC_TEMP :  -53.22 | VDDM : 1125.59 | AUX_INT :   -8.90 | CsaBias :   86.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29466e-03 / 2
  ADC_P0  : -8.89643e-03 ± 2.43948e-02
  ADC_P1  : 8.74378e-03 ± 6.26601e-04
  ADC_P2  : -6.00957e-06 ± 3.20618e-06
  CSA_Chi2/NDF : 1.25089e-04 / 2
  CSA_P0  : 5.74533e-02 ± 7.45988e-03
  CSA_P1  : 1.01533e-02 ± 5.62048e-04
  CSA_P2  : -4.85961e-05 ± 8.55933e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [21, 25, 35, 39, 44, 55, 92, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [6, 21, 65, 73, 84, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1563', '1.800', '0.1469', '1.800', '0.0850', '7.000', '0.7079', 1, 1, 1, 1, 1726070109.785911]
VI_after__Init : ['1.202', '0.1563', '1.800', '0.1468', '1.800', '0.0797', '7.000', '0.7078', 1, 1, 1, 1, 1726070117.8692272]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1398', '1.800', '0.1116', '7.000', '0.7090', 1, 1, 1, 1, 1726070177.7405202]