TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_27_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-008-12 | FUSED_ID : 6359364768398078092
  IC_TEMP :  -56.67 | VDDM : 1126.29 | AUX_INT :   -7.39 | CsaBias :   78.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.90466e-04 / 2
  CSA_P0  : 5.96576e-02 ± 9.20516e-03
  CSA_P1  : 1.01874e-02 ± 6.93543e-04
  CSA_P2  : -4.92900e-05 ± 1.05618e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 12, 15, 25, 69, 77, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 27, 29, 31, 46, 66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4228', '1.800', '0.1448', '1.799', '0.0996', '7.000', '0.7081', 1, 1, 1, 1, 1726072050.0413778]
VI_after__Init : ['1.202', '0.4229', '1.800', '0.1449', '1.800', '0.0938', '7.000', '0.7079', 1, 1, 1, 1, 1726072058.7345965]
VI_at__the_End : ['1.200', '0.5002', '1.800', '0.1415', '1.800', '0.1131', '7.000', '0.7090', 1, 1, 1, 1, 1726072123.968626]