TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_24_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-010-12 | FUSED_ID : 6359364768398078124
  IC_TEMP :  -55.61 | VDDM : 1098.26 | AUX_INT :   -7.63 | CsaBias :   66.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22871e-03 / 2
  ADC_P0  : -7.63466e-03 ± 2.37503e-02
  ADC_P1  : 8.23696e-03 ± 5.74198e-04
  ADC_P2  : -5.46876e-06 ± 2.75975e-06
  CSA_Chi2/NDF : 1.21570e-04 / 2
  CSA_P0  : 5.66755e-02 ± 7.35421e-03
  CSA_P1  : 9.35614e-03 ± 5.54087e-04
  CSA_P2  : -4.38241e-05 ± 8.43808e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 21, 22, 50, 113, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [87, 89, 107, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2666', '1.800', '0.1575', '1.800', '0.0928', '7.000', '0.7090', 1, 1, 1, 1, 1726071855.5652516]
VI_after__Init : ['1.202', '0.2663', '1.800', '0.1575', '1.800', '0.0856', '7.000', '0.7083', 1, 1, 1, 1, 1726071864.3246415]
VI_at__the_End : ['1.202', '0.4666', '1.800', '0.1341', '1.801', '0.1150', '7.000', '0.7088', 1, 1, 1, 1, 1726071931.4463935]