TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_22_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-011-12 | FUSED_ID : 6359364768398078140
  IC_TEMP :  -50.61 | VDDM : 1128.12 | AUX_INT :   -7.56 | CsaBias :   87.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31750e-03 / 2
  ADC_P0  : -7.56171e-03 ± 2.46299e-02
  ADC_P1  : 7.94277e-03 ± 5.80059e-04
  ADC_P2  : -4.77805e-06 ± 2.71717e-06
  CSA_Chi2/NDF : 1.51661e-04 / 2
  CSA_P0  : 5.95600e-02 ± 8.21407e-03
  CSA_P1  : 9.92503e-03 ± 6.18871e-04
  CSA_P2  : -4.59128e-05 ± 9.42468e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 27, 36, 58, 67, 68, 71, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 40, 69, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1995', '1.800', '0.1571', '1.799', '0.0872', '7.000', '0.7079', 1, 1, 1, 1, 1726071758.9556112]
VI_after__Init : ['1.202', '0.1994', '1.800', '0.1570', '1.800', '0.0814', '7.000', '0.7081', 1, 1, 1, 1, 1726071767.7029717]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1388', '1.800', '0.1132', '7.000', '0.7090', 1, 1, 1, 1, 1726071827.6594522]