TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_21_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-012-12 | FUSED_ID : 6359364768398078156
  IC_TEMP :  -59.49 | VDDM : 1130.45 | AUX_INT :   -7.36 | CsaBias :   85.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23799e-03 / 2
  ADC_P0  : -7.36445e-03 ± 2.38569e-02
  ADC_P1  : 8.53296e-03 ± 6.01181e-04
  ADC_P2  : -5.70974e-06 ± 3.00936e-06
  CSA_Chi2/NDF : 1.83407e-04 / 2
  CSA_P0  : 5.98341e-02 ± 9.03296e-03
  CSA_P1  : 1.04340e-02 ± 6.80568e-04
  CSA_P2  : -5.42536e-05 ± 1.03642e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 13, 26, 63, 65, 76, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4116', '1.800', '0.1668', '1.800', '0.0994', '7.000', '0.7082', 1, 1, 1, 1, 1726071662.9600756]
VI_after__Init : ['1.202', '0.4119', '1.800', '0.1669', '1.800', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1726071671.2274654]
VI_at__the_End : ['1.202', '0.4972', '1.800', '0.1394', '1.799', '0.1142', '7.000', '0.7088', 1, 1, 1, 1, 1726071737.3123834]