TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_17_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-014-12 | FUSED_ID : 6359364768398078188
  IC_TEMP :  -49.52 | VDDM : 1130.83 | AUX_INT :   -6.50 | CsaBias :   85.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.88232e-04 / 2
  ADC_P0  : -6.50034e-03 ± 2.12986e-02
  ADC_P1  : 8.45127e-03 ± 5.34850e-04
  ADC_P2  : -5.49121e-06 ± 2.66461e-06
  CSA_Chi2/NDF : 9.43186e-05 / 2
  CSA_P0  : 6.05779e-02 ± 6.47770e-03
  CSA_P1  : 9.58244e-03 ± 4.88048e-04
  CSA_P2  : -4.15594e-05 ± 7.43239e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [4, 6, 47, 59, 61, 64, 65, 89, 90, 105, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [18, 19, 37, 48, 80, 90, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4803', '1.800', '0.1693', '1.800', '0.0982', '7.000', '0.7090', 1, 1, 1, 1, 1726071468.342009]
VI_after__Init : ['1.202', '0.4808', '1.800', '0.1694', '1.800', '0.0911', '7.000', '0.7079', 1, 1, 1, 1, 1726071476.4223528]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1402', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1726071544.2731407]