TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_16_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-007-015-12 | FUSED_ID : 6359364768398078204
  IC_TEMP :  -51.52 | VDDM : 1132.03 | AUX_INT :   -5.98 | CsaBias :   74.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80716e-04 / 2
  ADC_P0  : -5.98407e-03 ± 2.12057e-02
  ADC_P1  : 8.14354e-03 ± 5.10412e-04
  ADC_P2  : -5.43964e-06 ± 2.42641e-06
  CSA_Chi2/NDF : 1.23093e-04 / 2
  CSA_P0  : 5.67798e-02 ± 7.40014e-03
  CSA_P1  : 9.51339e-03 ± 5.57547e-04
  CSA_P2  : -4.13250e-05 ± 8.49078e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 11, 15, 17, 28, 37, 38, 54, 70, 89, 90, 95, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [49, 109, 110, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2244', '1.800', '0.1780', '1.800', '0.0887', '7.000', '0.7081', 1, 1, 1, 1, 1726071371.6263783]
VI_after__Init : ['1.202', '0.2243', '1.800', '0.1780', '1.800', '0.0830', '7.000', '0.7079', 1, 1, 1, 1, 1726071379.6958034]
VI_at__the_End : ['1.200', '0.4906', '1.800', '0.1366', '1.800', '0.1104', '7.000', '0.7089', 1, 1, 1, 1, 1726071439.935154]