TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_40_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-004-08 | FUSED_ID : 6359364768398082120
  IC_TEMP :  -58.30 | VDDM : 1116.94 | AUX_INT :  -39.42 | CsaBias :   40.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.32176e-03 / 2
  ADC_P0  : -3.94227e-02 ± 3.44661e-02
  ADC_P1  : 8.96028e-03 ± 8.32959e-04
  ADC_P2  : -7.75022e-06 ± 4.01341e-06
  CSA_Chi2/NDF : 1.57654e-04 / 2
  CSA_P0  : 5.72967e-02 ± 8.37482e-03
  CSA_P1  : 1.00818e-02 ± 6.30982e-04
  CSA_P2  : -5.00445e-05 ± 9.60911e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [26, 46, 55, 58, 75, 79, 94, 104, 107, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [20, 30, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3931', '1.800', '0.1764', '1.799', '0.0952', '7.000', '0.7070', 1, 1, 1, 1, 1726072825.050979]
VI_after__Init : ['1.201', '0.3933', '1.800', '0.1766', '1.800', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1726072833.2265]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1392', '1.804', '0.1133', '7.000', '0.7079', 1, 1, 1, 1, 1726072899.7454076]