TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_45_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-007-08 | FUSED_ID : 6359364768398082168
  IC_TEMP :  -67.17 | VDDM : 1119.51 | AUX_INT :   -7.35 | CsaBias :   61.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05905e-03 / 2
  ADC_P0  : -7.35315e-03 ± 2.20494e-02
  ADC_P1  : 8.63245e-03 ± 5.63691e-04
  ADC_P2  : -5.93760e-06 ± 2.85077e-06
  CSA_Chi2/NDF : 2.01423e-04 / 2
  CSA_P0  : 5.77678e-02 ± 9.46623e-03
  CSA_P1  : 1.00820e-02 ± 7.13212e-04
  CSA_P2  : -5.45706e-05 ± 1.08614e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 26, 51, 64, 79, 99, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 5, 32, 68, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2026', '1.800', '0.1431', '1.799', '0.0850', '7.000', '0.7073', 1, 1, 1, 1, 1726073115.4888396]
VI_after__Init : ['1.201', '0.2025', '1.800', '0.1431', '1.801', '0.0793', '7.000', '0.7072', 1, 1, 1, 1, 1726073123.661278]
VI_at__the_End : ['1.202', '0.4723', '1.800', '0.1404', '1.800', '0.1170', '7.000', '0.7079', 1, 1, 1, 1, 1726073189.2891953]