TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_46_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-008-08 | FUSED_ID : 6359364768398082184
  IC_TEMP :  -62.77 | VDDM : 1115.51 | AUX_INT :   -7.08 | CsaBias :   58.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85580e-04 / 2
  ADC_P0  : -7.07991e-03 ± 2.12720e-02
  ADC_P1  : 8.28134e-03 ± 5.24271e-04
  ADC_P2  : -5.31624e-06 ± 2.55660e-06
  CSA_Chi2/NDF : 1.70552e-04 / 2
  CSA_P0  : 5.79250e-02 ± 8.71064e-03
  CSA_P1  : 9.91031e-03 ± 6.56284e-04
  CSA_P2  : -5.16966e-05 ± 9.99443e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [11, 14, 24, 33, 42, 43, 47, 62, 66, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [0, 12, 20, 23, 40, 64, 78, 87, 95, 96, 108, 112, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1349', '1.800', '0.1557', '1.799', '0.0815', '7.000', '0.7072', 1, 1, 1, 1, 1726073212.999478]
VI_after__Init : ['1.202', '0.1347', '1.800', '0.1555', '1.801', '0.0763', '7.000', '0.7069', 1, 1, 1, 1, 1726073221.1948118]
VI_at__the_End : ['1.201', '0.4726', '1.800', '0.1386', '1.800', '0.1167', '7.000', '0.7080', 1, 1, 1, 1, 1726073287.215816]