TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_50_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-010-08 | FUSED_ID : 6359364768398082216
  IC_TEMP :  -65.19 | VDDM : 1122.46 | AUX_INT :   -8.03 | CsaBias :   61.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73138e-04 / 2
  ADC_P0  : -8.02638e-03 ± 2.10696e-02
  ADC_P1  : 8.70466e-03 ± 5.27832e-04
  ADC_P2  : -6.90008e-06 ± 2.61871e-06
  CSA_Chi2/NDF : 1.50460e-04 / 2
  CSA_P0  : 6.01428e-02 ± 8.18151e-03
  CSA_P1  : 9.88095e-03 ± 6.16418e-04
  CSA_P2  : -5.26657e-05 ± 9.38731e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [110, 111, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [21, 32, 106, 107, 112, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1923', '1.800', '0.1674', '1.800', '0.0837', '7.000', '0.7072', 1, 1, 1, 1, 1726073406.6506636]
VI_after__Init : ['1.201', '0.1923', '1.800', '0.1673', '1.800', '0.0783', '7.000', '0.7071', 1, 1, 1, 1, 1726073414.7239928]
VI_at__the_End : ['1.202', '0.4701', '1.800', '0.1380', '1.803', '0.1166', '7.000', '0.7083', 1, 1, 1, 1, 1726073473.889458]