TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_58_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-015-08 | FUSED_ID : 6359364768398082296
  IC_TEMP :  -53.95 | VDDM : 1123.18 | AUX_INT :   -7.50 | CsaBias :   71.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.40605e-04 / 2
  ADC_P0  : -7.49741e-03 ± 2.07376e-02
  ADC_P1  : 8.81014e-03 ± 5.33713e-04
  ADC_P2  : -6.65430e-06 ± 2.71679e-06
  CSA_Chi2/NDF : 1.65749e-04 / 2
  CSA_P0  : 6.01879e-02 ± 8.58711e-03
  CSA_P1  : 1.02654e-02 ± 6.46977e-04
  CSA_P2  : -5.19984e-05 ± 9.85270e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [28, 49, 57, 69, 92, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 30, 36, 55, 72, 84, 100, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3193', '1.800', '0.1881', '1.800', '0.0892', '7.000', '0.7074', 1, 1, 1, 1, 1726073890.9006805]
VI_after__Init : ['1.202', '0.3190', '1.800', '0.1880', '1.800', '0.0840', '7.000', '0.7076', 1, 1, 1, 1, 1726073898.9659934]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1408', '1.799', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1726073959.2653036]