TEST_NAME : Wafer
TEST_DATE : 24_09_11-18_59_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-016-15 | FUSED_ID : 6359364768398082319
  IC_TEMP :  -53.70 | VDDM : 1132.41 | AUX_INT :   -6.09 | CsaBias :   77.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.48289e-04 / 2
  ADC_P0  : -6.08571e-03 ± 1.96963e-02
  ADC_P1  : 8.43499e-03 ± 4.88577e-04
  ADC_P2  : -5.92924e-06 ± 2.39756e-06
  CSA_Chi2/NDF : 1.06986e-04 / 2
  CSA_P0  : 6.00574e-02 ± 6.89900e-03
  CSA_P1  : 9.88637e-03 ± 5.19790e-04
  CSA_P2  : -4.49649e-05 ± 7.91578e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [29, 35, 37, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 41, 88, 96, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1624', '1.800', '0.1461', '1.799', '0.0814', '7.000', '0.7076', 1, 1, 1, 1, 1726073987.721206]
VI_after__Init : ['1.202', '0.1625', '1.800', '0.1461', '1.800', '0.0760', '7.000', '0.7076', 1, 1, 1, 1, 1726073995.784583]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1429', '1.800', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1726074062.9384804]