TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_11_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-008-023-15 | FUSED_ID : 6359364768398082431
  IC_TEMP :  -53.39 | VDDM : 1116.77 | AUX_INT :   -8.31 | CsaBias :   73.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42942e-03 / 2
  ADC_P0  : -8.31334e-03 ± 2.56661e-02
  ADC_P1  : 8.24420e-03 ± 6.27273e-04
  ADC_P2  : -5.25372e-06 ± 3.03987e-06
  CSA_Chi2/NDF : 8.73189e-05 / 2
  CSA_P0  : 5.77728e-02 ± 6.23270e-03
  CSA_P1  : 9.47328e-03 ± 4.69589e-04
  CSA_P2  : -4.42493e-05 ± 7.15129e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [29, 45, 48, 55, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [44, 54, 57, 59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3927', '1.800', '0.1481', '1.800', '0.0971', '7.000', '0.7080', 1, 1, 1, 1, 1726074660.284317]
VI_after__Init : ['1.201', '0.3917', '1.800', '0.1479', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1726074668.3175995]
VI_at__the_End : ['1.201', '0.4751', '1.800', '0.1367', '1.803', '0.1147', '7.000', '0.7084', 1, 1, 1, 1, 1726074735.4648008]