TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_56_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-004-05 | FUSED_ID : 6359364768398086213
  IC_TEMP :  -60.72 | VDDM : 1120.11 | AUX_INT :   -7.39 | CsaBias :   73.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21889e-03 / 2
  ADC_P0  : -7.39009e-03 ± 2.36761e-02
  ADC_P1  : 8.18443e-03 ± 5.74807e-04
  ADC_P2  : -5.32777e-06 ± 2.75743e-06
  CSA_Chi2/NDF : 1.74446e-04 / 2
  CSA_P0  : 5.88462e-02 ± 8.80953e-03
  CSA_P1  : 9.79318e-03 ± 6.63735e-04
  CSA_P2  : -4.68089e-05 ± 1.01079e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 31, 43, 61, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [20, 37, 60, 74, 79, 81, 97, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2662', '1.800', '0.1559', '1.800', '0.0916', '7.000', '0.7083', 1, 1, 1, 1, 1726077373.9554167]
VI_after__Init : ['1.202', '0.2664', '1.800', '0.1559', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1726077382.0187938]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1429', '1.800', '0.1152', '7.000', '0.7090', 1, 1, 1, 1, 1726077448.693503]