TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_38_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-015-05 | FUSED_ID : 6359364768398086389
  IC_TEMP :  -51.90 | VDDM : 1135.41 | AUX_INT :   -7.13 | CsaBias :   97.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73042e-04 / 2
  ADC_P0  : -7.12546e-03 ± 2.11290e-02
  ADC_P1  : 8.13439e-03 ± 5.10198e-04
  ADC_P2  : -5.19509e-06 ± 2.43873e-06
  CSA_Chi2/NDF : 9.26528e-05 / 2
  CSA_P0  : 6.12480e-02 ± 6.42024e-03
  CSA_P1  : 9.62045e-03 ± 4.83719e-04
  CSA_P2  : -4.05788e-05 ± 7.36647e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [12, 33, 38, 87, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 38, 45, 72, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2387', '1.800', '0.1415', '1.800', '0.0950', '7.000', '0.7081', 1, 1, 1, 1, 1726076308.5989122]
VI_after__Init : ['1.202', '0.2387', '1.800', '0.1415', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1726076316.7284162]
VI_at__the_End : ['1.202', '0.5029', '1.800', '0.1408', '1.800', '0.1119', '7.000', '0.7087', 1, 1, 1, 1, 1726076384.620683]