TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_35_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-017-02 | FUSED_ID : 6359364768398086418
  IC_TEMP :  -57.01 | VDDM : 1128.05 | AUX_INT :   -8.96 | CsaBias :   74.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19535e-03 / 2
  ADC_P0  : -8.96325e-03 ± 2.33809e-02
  ADC_P1  : 8.41144e-03 ± 5.68790e-04
  ADC_P2  : -6.12553e-06 ± 2.75046e-06
  CSA_Chi2/NDF : 1.29312e-04 / 2
  CSA_P0  : 5.89730e-02 ± 7.58477e-03
  CSA_P1  : 1.02494e-02 ± 5.71458e-04
  CSA_P2  : -5.08163e-05 ± 8.70263e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [41, 42, 54, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 9, 43, 76, 90, 94, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4144', '1.800', '0.1559', '1.800', '0.0960', '7.000', '0.7079', 1, 1, 1, 1, 1726076114.7174203]
VI_after__Init : ['1.202', '0.4143', '1.800', '0.1560', '1.800', '0.0901', '7.000', '0.7077', 1, 1, 1, 1, 1726076122.856683]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1384', '1.800', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1726076190.0656643]