TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_30_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-020-02 | FUSED_ID : 6359364768398086466
  IC_TEMP :  -55.14 | VDDM : 1128.67 | AUX_INT :   -8.10 | CsaBias :   73.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10856e-03 / 2
  ADC_P0  : -8.10345e-03 ± 2.25119e-02
  ADC_P1  : 8.23729e-03 ± 5.36191e-04
  ADC_P2  : -6.09167e-06 ± 2.52600e-06
  CSA_Chi2/NDF : 1.25501e-04 / 2
  CSA_P0  : 5.88487e-02 ± 7.47217e-03
  CSA_P1  : 1.00046e-02 ± 5.62974e-04
  CSA_P2  : -4.62825e-05 ± 8.57342e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [35, 41, 55, 75, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 17, 41, 87, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2358', '1.800', '0.1423', '1.800', '0.0873', '7.000', '0.7086', 1, 1, 1, 1, 1726075823.0274627]
VI_after__Init : ['1.202', '0.2358', '1.800', '0.1423', '1.800', '0.0799', '7.000', '0.7079', 1, 1, 1, 1, 1726075831.82378]
VI_at__the_End : ['1.202', '0.5014', '1.800', '0.1399', '1.800', '0.1129', '7.000', '0.7086', 1, 1, 1, 1, 1726075889.941373]