TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_28_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-021-02 | FUSED_ID : 6359364768398086482
  IC_TEMP :  -51.40 | VDDM : 1131.65 | AUX_INT :   -8.96 | CsaBias :   83.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 7.08690e-05 / 2
  CSA_P0  : 5.91644e-02 ± 5.61501e-03
  CSA_P1  : 9.36864e-03 ± 4.23050e-04
  CSA_P2  : -3.72482e-05 ± 6.44256e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 22, 24, 104, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 35, 36, 38, 75, 76, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2423', '1.800', '0.1314', '1.800', '0.0923', '7.000', '0.7087', 1, 1, 1, 1, 1726075726.5757084]
VI_after__Init : ['1.202', '0.2422', '1.800', '0.1315', '1.800', '0.0844', '7.000', '0.7079', 1, 1, 1, 1, 1726075734.551022]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1387', '1.803', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1726075801.5420623]