TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_27_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-022-02 | FUSED_ID : 6359364768398086498
  IC_TEMP :  -51.25 | VDDM : 1135.61 | AUX_INT :   -7.85 | CsaBias :   81.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16222e-03 / 2
  ADC_P0  : -7.85062e-03 ± 2.31089e-02
  ADC_P1  : 8.22054e-03 ± 5.59882e-04
  ADC_P2  : -5.44134e-06 ± 2.68846e-06
  CSA_Chi2/NDF : 1.38849e-04 / 2
  CSA_P0  : 6.09498e-02 ± 7.85947e-03
  CSA_P1  : 1.00184e-02 ± 5.92155e-04
  CSA_P2  : -4.51187e-05 ± 9.01782e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [21, 52, 63, 103, 110, 112, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 20, 36, 45, 52, 95, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4491', '1.800', '0.1766', '1.800', '0.0960', '7.000', '0.7080', 1, 1, 1, 1, 1726075628.7350876]
VI_after__Init : ['1.202', '0.4493', '1.800', '0.1766', '1.800', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1726075636.7824085]
VI_at__the_End : ['1.202', '0.5068', '1.800', '0.1412', '1.800', '0.1125', '7.000', '0.7087', 1, 1, 1, 1, 1726075697.4189618]