TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_23_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-024-02 | FUSED_ID : 6359364768398086530
  IC_TEMP :  -54.80 | VDDM : 1128.53 | AUX_INT :   -6.79 | CsaBias :   67.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19618e-03 / 2
  ADC_P0  : -6.79380e-03 ± 2.34525e-02
  ADC_P1  : 8.34905e-03 ± 5.79992e-04
  ADC_P2  : -5.49886e-06 ± 2.84154e-06
  CSA_Chi2/NDF : 1.55307e-04 / 2
  CSA_P0  : 5.78647e-02 ± 8.31223e-03
  CSA_P1  : 1.01906e-02 ± 6.26267e-04
  CSA_P2  : -4.79707e-05 ± 9.53730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 26, 61, 111, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 17, 19, 30, 69, 81, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1927', '1.800', '0.1926', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1726075435.3596678]
VI_after__Init : ['1.202', '0.1928', '1.800', '0.1926', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1726075443.5019248]
VI_at__the_End : ['1.202', '0.5042', '1.800', '0.1387', '1.800', '0.1128', '7.000', '0.7085', 1, 1, 1, 1, 1726075501.3766854]