TEST_NAME : Wafer
TEST_DATE : 24_09_11-19_19_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-009-027-02 | FUSED_ID : 6359364768398086578
  IC_TEMP :  -54.04 | VDDM : 1132.56 | AUX_INT :   -4.86 | CsaBias :   79.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.20440e-04 / 2
  ADC_P0  : -4.85635e-03 ± 1.81918e-02
  ADC_P1  : 8.46799e-03 ± 4.67674e-04
  ADC_P2  : -4.96891e-06 ± 2.37896e-06
  CSA_Chi2/NDF : 1.41828e-04 / 2
  CSA_P0  : 5.97089e-02 ± 7.94334e-03
  CSA_P1  : 1.02876e-02 ± 5.98473e-04
  CSA_P2  : -4.90363e-05 ± 9.11404e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [45, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 39, 45, 52, 66, 70, 103, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4367', '1.800', '0.1625', '1.799', '0.0933', '7.000', '0.7078', 1, 1, 1, 1, 1726075144.1894586]
VI_after__Init : ['1.202', '0.4369', '1.800', '0.1625', '1.800', '0.0887', '7.000', '0.7078', 1, 1, 1, 1, 1726075152.236917]
VI_at__the_End : ['1.202', '0.5111', '1.800', '0.1399', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1726075220.5507662]