TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_17_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-010-012-11 | FUSED_ID : 6359364768398090443
  IC_TEMP :  -48.88 | VDDM : 1134.33 | AUX_INT :   -5.69 | CsaBias :   72.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.17274e-04 / 2
  ADC_P0  : -5.68513e-03 ± 1.81292e-02
  ADC_P1  : 7.90638e-03 ± 4.28546e-04
  ADC_P2  : -4.88290e-06 ± 1.99785e-06
  CSA_Chi2/NDF : 9.41078e-05 / 2
  CSA_P0  : 6.03127e-02 ± 6.47046e-03
  CSA_P1  : 9.64841e-03 ± 4.87503e-04
  CSA_P2  : -4.06805e-05 ± 7.42409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 36, 41, 78, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 28, 69, 75, 99, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2126', '1.800', '0.1226', '1.799', '0.0896', '7.000', '0.7072', 1, 1, 1, 1, 1726078635.8833113]
VI_after__Init : ['1.200', '0.2125', '1.800', '0.1227', '1.800', '0.0839', '7.000', '0.7072', 1, 1, 1, 1, 1726078643.9756954]
VI_at__the_End : ['1.198', '0.5006', '1.800', '0.1421', '1.800', '0.1101', '7.000', '0.7077', 1, 1, 1, 1, 1726078710.966806]