TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_26_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-010-018-12 | FUSED_ID : 6359364768398090540
  IC_TEMP :  -57.94 | VDDM : 1129.12 | AUX_INT :   -8.03 | CsaBias :   86.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73138e-04 / 2
  ADC_P0  : -8.02638e-03 ± 2.10696e-02
  ADC_P1  : 8.70466e-03 ± 5.27832e-04
  ADC_P2  : -6.90008e-06 ± 2.61871e-06
  CSA_Chi2/NDF : 1.23034e-04 / 2
  CSA_P0  : 6.22847e-02 ± 7.39836e-03
  CSA_P1  : 1.03168e-02 ± 5.57413e-04
  CSA_P2  : -4.98215e-05 ± 8.48874e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [13, 43, 73, 74, 77, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 27, 42, 47, 64, 81, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1722', '1.800', '0.1516', '1.800', '0.0844', '7.000', '0.7071', 1, 1, 1, 1, 1726079215.9946125]
VI_after__Init : ['1.202', '0.1722', '1.800', '0.1507', '1.800', '0.0788', '7.000', '0.7074', 1, 1, 1, 1, 1726079224.2829976]
VI_at__the_End : ['1.197', '0.5103', '1.800', '0.1438', '1.809', '0.1129', '7.000', '0.7080', 1, 1, 1, 1, 1726079284.0066094]