TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_41_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-010-027-12 | FUSED_ID : 6359364768398090684
  IC_TEMP :  -57.30 | VDDM : 1120.45 | AUX_INT :   -8.52 | CsaBias :   85.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53873e-03 / 2
  ADC_P0  : -8.51680e-03 ± 2.66299e-02
  ADC_P1  : 8.58686e-03 ± 6.74901e-04
  ADC_P2  : -5.85065e-06 ± 3.39120e-06
  CSA_Chi2/NDF : 1.57858e-04 / 2
  CSA_P0  : 5.74436e-02 ± 8.38022e-03
  CSA_P1  : 1.01355e-02 ± 6.31389e-04
  CSA_P2  : -4.82412e-05 ± 9.61530e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 51, 96, 108, 109, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 23, 48, 95, 109, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4140', '1.800', '0.1227', '1.800', '0.0985', '7.000', '0.7083', 1, 1, 1, 1, 1726080087.4093063]
VI_after__Init : ['1.202', '0.4141', '1.800', '0.1227', '1.800', '0.0903', '7.000', '0.7078', 1, 1, 1, 1, 1726080095.5337434]
VI_at__the_End : ['1.201', '0.5001', '1.800', '0.1369', '1.800', '0.1132', '7.000', '0.7083', 1, 1, 1, 1, 1726080163.4955418]