TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_23_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-002-06 | FUSED_ID : 6359364768398094374
  IC_TEMP :  -58.68 | VDDM : 1126.33 | AUX_INT :   -8.04 | CsaBias :   76.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24698e-03 / 2
  ADC_P0  : -8.04456e-03 ± 2.39358e-02
  ADC_P1  : 8.56040e-03 ± 6.01166e-04
  ADC_P2  : -6.05199e-06 ± 2.99205e-06
  CSA_Chi2/NDF : 1.71610e-04 / 2
  CSA_P0  : 6.02023e-02 ± 8.73763e-03
  CSA_P1  : 1.01396e-02 ± 6.58317e-04
  CSA_P2  : -4.85250e-05 ± 1.00254e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 57, 61, 64, 96, 102, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 55, 69, 90, 116, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1761', '1.800', '0.1657', '1.800', '0.0824', '7.000', '0.7080', 1, 1, 1, 1, 1726082609.4143412]
VI_after__Init : ['1.202', '0.1761', '1.800', '0.1655', '1.800', '0.0771', '7.000', '0.7076', 1, 1, 1, 1, 1726082617.5326934]
VI_at__the_End : ['1.202', '0.5029', '1.800', '0.1436', '1.800', '0.1132', '7.000', '0.7086', 1, 1, 1, 1, 1726082678.0181563]