TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_20_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-004-06 | FUSED_ID : 6359364768398094406
  IC_TEMP :  -53.82 | VDDM : 1113.93 | AUX_INT :   -9.45 | CsaBias :   81.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55130e-03 / 2
  ADC_P0  : -9.44551e-03 ± 2.66982e-02
  ADC_P1  : 8.33732e-03 ± 6.45609e-04
  ADC_P2  : -5.94554e-06 ± 3.10004e-06
  CSA_Chi2/NDF : 8.03029e-05 / 2
  CSA_P0  : 5.97254e-02 ± 5.97706e-03
  CSA_P1  : 9.70190e-03 ± 4.50329e-04
  CSA_P2  : -4.09677e-05 ± 6.85797e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 10, 46, 52, 93, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 26, 108, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2974', '1.800', '0.1958', '1.800', '0.0886', '7.000', '0.7077', 1, 1, 1, 1, 1726082415.442888]
VI_after__Init : ['1.202', '0.2974', '1.800', '0.1957', '1.800', '0.0831', '7.000', '0.7078', 1, 1, 1, 1, 1726082423.6762793]
VI_at__the_End : ['1.201', '0.5041', '1.800', '0.1403', '1.800', '0.1113', '7.000', '0.7087', 1, 1, 1, 1, 1726082491.0681758]