TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_17_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-006-06 | FUSED_ID : 6359364768398094438
  IC_TEMP :  -52.41 | VDDM : 1128.32 | AUX_INT :   -7.72 | CsaBias :   96.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85276e-04 / 2
  ADC_P0  : -7.72024e-03 ± 2.12388e-02
  ADC_P1  : 8.05166e-03 ± 5.00050e-04
  ADC_P2  : -5.45292e-06 ± 2.33334e-06
  CSA_Chi2/NDF : 8.28980e-05 / 2
  CSA_P0  : 6.13649e-02 ± 6.07288e-03
  CSA_P1  : 9.33963e-03 ± 4.57547e-04
  CSA_P2  : -3.66775e-05 ± 6.96791e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 74, 77, 81, 99, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 7, 18, 24, 83, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4351', '1.800', '0.1365', '1.800', '0.0947', '7.000', '0.7079', 1, 1, 1, 1, 1726082222.004717]
VI_after__Init : ['1.202', '0.4353', '1.800', '0.1366', '1.800', '0.0888', '7.000', '0.7080', 1, 1, 1, 1, 1726082230.0111325]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1401', '1.800', '0.1122', '7.000', '0.7086', 1, 1, 1, 1, 1726082293.181217]