TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_15_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-007-06 | FUSED_ID : 6359364768398094454
  IC_TEMP :  -58.65 | VDDM : 1120.49 | AUX_INT :   -8.28 | CsaBias :   83.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23445e-03 / 2
  ADC_P0  : -8.28473e-03 ± 2.38067e-02
  ADC_P1  : 8.41331e-03 ± 5.85581e-04
  ADC_P2  : -5.92085e-06 ± 2.85558e-06
  CSA_Chi2/NDF : 1.27415e-04 / 2
  CSA_P0  : 5.92580e-02 ± 7.52892e-03
  CSA_P1  : 1.00263e-02 ± 5.67250e-04
  CSA_P2  : -4.83087e-05 ± 8.63855e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 38, 40, 50, 63, 93, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 31, 75, 104, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4721', '1.800', '0.1578', '1.800', '0.1026', '7.000', '0.7078', 1, 1, 1, 1, 1726082124.5072877]
VI_after__Init : ['1.201', '0.4728', '1.800', '0.1578', '1.800', '0.0971', '7.000', '0.7079', 1, 1, 1, 1, 1726082133.2666256]
VI_at__the_End : ['1.202', '0.4954', '1.800', '0.1418', '1.802', '0.1139', '7.000', '0.7087', 1, 1, 1, 1, 1726082192.9570048]