TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_13_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-008-06 | FUSED_ID : 6359364768398094470
  IC_TEMP :  -53.81 | VDDM : 1124.22 | AUX_INT :   -7.80 | CsaBias :   59.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.47779e-04 / 2
  ADC_P0  : -7.79974e-03 ± 2.08032e-02
  ADC_P1  : 8.49408e-03 ± 5.13210e-04
  ADC_P2  : -6.31508e-06 ± 2.50661e-06
  CSA_Chi2/NDF : 8.48126e-05 / 2
  CSA_P0  : 5.81513e-02 ± 6.14260e-03
  CSA_P1  : 9.32965e-03 ± 4.62801e-04
  CSA_P2  : -3.87225e-05 ± 7.04791e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [4, 5, 19, 32, 39, 57, 78, 103, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [9, 24, 39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3338', '1.800', '0.1325', '1.800', '0.0940', '7.000', '0.7086', 1, 1, 1, 1, 1726082027.5788147]
VI_after__Init : ['1.201', '0.3339', '1.800', '0.1325', '1.800', '0.0865', '7.000', '0.7077', 1, 1, 1, 1, 1726082036.3301191]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1399', '1.804', '0.1120', '7.000', '0.7086', 1, 1, 1, 1, 1726082104.357862]