TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_10_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-010-06 | FUSED_ID : 6359364768398094502
  IC_TEMP :  -49.69 | VDDM : 1123.95 | AUX_INT :   -8.64 | CsaBias :   87.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11941e-03 / 2
  ADC_P0  : -8.64184e-03 ± 2.26287e-02
  ADC_P1  : 8.07886e-03 ± 5.31638e-04
  ADC_P2  : -5.50876e-06 ± 2.48283e-06
  CSA_Chi2/NDF : 1.04692e-04 / 2
  CSA_P0  : 5.89436e-02 ± 6.82464e-03
  CSA_P1  : 9.64519e-03 ± 5.14187e-04
  CSA_P2  : -4.23809e-05 ± 7.83046e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 17, 30, 71, 84, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [35, 37, 43, 103, 121, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3552', '1.800', '0.1745', '1.800', '0.0943', '7.000', '0.7080', 1, 1, 1, 1, 1726081833.277892]
VI_after__Init : ['1.202', '0.3554', '1.800', '0.1745', '1.800', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1726081841.3792388]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1377', '1.799', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1726081908.3030293]