TEST_NAME : Wafer
TEST_DATE : 24_09_11-21_07_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-012-06 | FUSED_ID : 6359364768398094534
  IC_TEMP :  -54.30 | VDDM : 1133.93 | AUX_INT :  -10.44 | CsaBias :   91.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83921e-03 / 2
  ADC_P0  : -1.04392e-02 ± 2.91205e-02
  ADC_P1  : 8.53816e-03 ± 7.26000e-04
  ADC_P2  : -5.75713e-06 ± 3.61448e-06
  CSA_Chi2/NDF : 1.11070e-04 / 2
  CSA_P0  : 6.08089e-02 ± 7.02943e-03
  CSA_P1  : 9.89340e-03 ± 5.29617e-04
  CSA_P2  : -4.48955e-05 ± 8.06544e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [40, 93, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 6, 28, 68, 83, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1976', '1.800', '0.1595', '1.800', '0.0872', '7.000', '0.7078', 1, 1, 1, 1, 1726081638.1890035]
VI_after__Init : ['1.202', '0.1978', '1.800', '0.1582', '1.800', '0.0816', '7.000', '0.7079', 1, 1, 1, 1, 1726081646.2523696]
VI_at__the_End : ['1.202', '0.5007', '1.800', '0.1403', '1.800', '0.1130', '7.000', '0.7089', 1, 1, 1, 1, 1726081707.702579]