TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_56_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-019-01 | FUSED_ID : 6359364768398094641
  IC_TEMP :  -55.26 | VDDM : 1134.74 | AUX_INT :   -6.01 | CsaBias :   75.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.62149e-04 / 2
  ADC_P0  : -6.00964e-03 ± 1.98681e-02
  ADC_P1  : 8.23537e-03 ± 4.84835e-04
  ADC_P2  : -5.64960e-06 ± 2.32734e-06
  CSA_Chi2/NDF : 1.10753e-04 / 2
  CSA_P0  : 6.04382e-02 ± 7.01940e-03
  CSA_P1  : 9.93610e-03 ± 5.28861e-04
  CSA_P2  : -4.41190e-05 ± 8.05393e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 68, 87, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 29, 74, 79, 88, 91, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3146', '1.800', '0.1877', '1.800', '0.0901', '7.000', '0.7077', 1, 1, 1, 1, 1726080960.1183898]
VI_after__Init : ['1.202', '0.3146', '1.800', '0.1877', '1.800', '0.0843', '7.000', '0.7079', 1, 1, 1, 1, 1726080968.851755]
VI_at__the_End : ['1.202', '0.5064', '1.800', '0.1413', '1.806', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1726081027.9869077]