TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_52_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-021-01 | FUSED_ID : 6359364768398094673
  IC_TEMP :  -51.74 | VDDM : 1132.19 | AUX_INT :   -8.86 | CsaBias :   91.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30442e-03 / 2
  ADC_P0  : -8.85965e-03 ± 2.44536e-02
  ADC_P1  : 8.46071e-03 ± 5.98257e-04
  ADC_P2  : -6.27496e-06 ± 2.90379e-06
  CSA_Chi2/NDF : 9.47817e-05 / 2
  CSA_P0  : 5.95720e-02 ± 6.49359e-03
  CSA_P1  : 9.86531e-03 ± 4.89245e-04
  CSA_P2  : -4.27703e-05 ± 7.45062e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 22, 69, 80, 92, 99, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 18, 36, 43, 45, 52, 99, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1524', '1.800', '0.1506', '1.800', '0.0898', '7.000', '0.7086', 1, 1, 1, 1, 1726080766.998952]
VI_after__Init : ['1.202', '0.1525', '1.800', '0.1505', '1.799', '0.0824', '7.000', '0.7078', 1, 1, 1, 1, 1726080775.0813847]
VI_at__the_End : ['1.201', '0.5079', '1.800', '0.1401', '1.803', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1726080836.482353]