TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_47_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-024-01 | FUSED_ID : 6359364768398094721
  IC_TEMP :  -54.28 | VDDM : 1119.01 | AUX_INT :   -9.01 | CsaBias :   73.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45128e-03 / 2
  ADC_P0  : -9.00552e-03 ± 2.58502e-02
  ADC_P1  : 8.27605e-03 ± 6.30452e-04
  ADC_P2  : -5.33594e-06 ± 3.05825e-06
  CSA_Chi2/NDF : 1.51818e-04 / 2
  CSA_P0  : 6.00808e-02 ± 8.21834e-03
  CSA_P1  : 1.04345e-02 ± 6.19193e-04
  CSA_P2  : -5.28114e-05 ± 9.42957e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 2, 7, 9, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [49, 76, 99, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1391', '1.800', '0.1829', '1.800', '0.0862', '7.000', '0.7080', 1, 1, 1, 1, 1726080475.8183305]
VI_after__Init : ['1.202', '0.1392', '1.800', '0.1827', '1.800', '0.0807', '7.000', '0.7077', 1, 1, 1, 1, 1726080483.945656]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1409', '1.800', '0.1135', '7.000', '0.7083', 1, 1, 1, 1, 1726080551.7987835]