TEST_NAME : Wafer
TEST_DATE : 24_09_11-20_46_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-011-025-01 | FUSED_ID : 6359364768398094737
  IC_TEMP :  -56.19 | VDDM : 1125.33 | AUX_INT :   -8.09 | CsaBias :   76.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10798e-03 / 2
  ADC_P0  : -8.08669e-03 ± 2.25276e-02
  ADC_P1  : 8.52683e-03 ± 5.60736e-04
  ADC_P2  : -6.17439e-06 ± 2.76456e-06
  CSA_Chi2/NDF : 1.14900e-04 / 2
  CSA_P0  : 6.14899e-02 ± 7.14960e-03
  CSA_P1  : 9.82120e-03 ± 5.38671e-04
  CSA_P2  : -4.30717e-05 ± 8.20332e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [63, 112, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [2, 19, 47, 66, 84, 85, 96, 107, 110, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4235', '1.800', '0.1626', '1.800', '0.1003', '7.000', '0.7079', 1, 1, 1, 1, 1726080378.457786]
VI_after__Init : ['1.202', '0.4238', '1.800', '0.1627', '1.800', '0.0946', '7.000', '0.7078', 1, 1, 1, 1, 1726080387.3849847]
VI_at__the_End : ['1.202', '0.5056', '1.800', '0.1412', '1.800', '0.1118', '7.000', '0.7085', 1, 1, 1, 1, 1726080446.7668211]